More info about GENESIS [Archive]

Tom

11-22-2002, 02:35 PM

Genesis Software was developed by Valor and is sold by "Frontline PCB Solutions LP". It's also sold with the Orbotech direct imaging equipment as their operating system.

You can get a product description by going to this website http://www.valor.com/ and select the SOLUTIONS button. Then select the Genesis 2000 button.

Here's the product migration path........

Genesis 2000 Customized Improvements

Customized improvements to Genesis 2000 are frequently made and are available for download.

Genesis 2000 Upgrade Path

Find out what actions need be taken to upgrade your version to another version.

Genesis 2000 Version 8.1

Major New Features
Graphic Editor
Support for plated rout
New drill verification coupon
DFM & Analysis
Positive clearance optimization DFM
Test point identification
I/O Process
Support for ESI laser drill output (Output)
IPC356A input (netlist only) (Input)
System
Support for Linux
ETM
Automatic creation of ETM adapter configuration from a given ET set
Hiyoki output
Trace output
Major Enhancements
System
Ability to enter values in GUI in different units, independent of the current units (e.g. 5mm, 20mil, 35mic)
Defaults values for nearly ALL windows may be saved
More tool tips
Tools for database management
Improved printing quality
Support for metric units in attributes and configuration parameters
Engineering Toolkit
Faster open job procedure (special symbols are not read on job open)
Job names entered without wildcards open immediately, without needing additional mouse clicks.
Orbotech Vision Interface
Faster load and save
Orbotech PC/I Interface
Improvements in U.I.
Input/Output
Enhancements to input reports
New input format - IPC-D-356A
More tool-tips
Autoplot input now supports full Step & Repeat. SUBFigures can now be translated into PCBs.
New DXF output parameters:
output files - controls how job layers are output
contour to hatch - controls how Genesis outputs contours

Algorithms
Improvements in pattern-filling algorithm (thieving/venting)
Faster shapelist creation
Line Unification DFM is able to unify segmented arcs
Graphic Editor
Support for board net in graphic editor
Improvements in rout editor
Support for rout to dust (pocketing)
Enhancements in analysis result viewer
Thermal recognition and substitution
Convert a surface with curves to a surface made only of segments
DFM & Analysis
DFM and analysis results are automatically sorted from smallest to largest. This allows the operator to view the most acute violations first.
Enhancements in signal layer analysis
Enhancements in NFPR
Enhancements to signal layer optimization
Mask Areas and Ignore Attribute for selected actions
Support for board net in spacing checks
Tangency Elimination enhancement fixes tangencies between surfaces
Dynamic Etch Compensation improvements (including simplified UI)
Surface Analysis enhancement (fold detection)
Support for thermal pads in auto-pad construction
Auto Drill Manager
Enhancements in tool assignment
Enhancements in start/end coupon
Netlist Analyzer
Improvements in U.I.
Netlist optimizer
Improvements in U.I.
Improvements to Algorithms
Alignment points support
ETM
Improved pin to grid algorithm
Automatic Split
Minimize number of guiding plates
Auto Run
Pin Loading mask
Set of field-approved adapter configurations
Clamshell definition support - including viewer
Automatic addition of Tooling pins and Air holes
Plate removal rules to reduce number of unnecessary plates

Genesis 2000 Version 8.0b

Major New Features
Simple Fault Viewer
This package allows viewing faults discovered by electrical testing
NEC format
Genesis now supports input and output of NEC's PCB CAD/CAM format.
Orbotech Vision AOI Interface
AOI Interface for Orbotech's Vision series automated inspection machines
ODB++ Messenger extension
An email-like mechanism for communication with ODB++ Communicator clients.
Major Enhancements
Improvements in the panelization wizard
Panelization schemes may be defined to add thieving-like patterns to soldermask layers
Panelization schemes may be defined to add traces to the panel
Multiple Image Managers
When outputting to Image manager, the operator (or script) may choose which image manager process it wishes to send to.
Improvements to PC/I AOI interface
New Option in Graphic Interface: CDR Set > Reload Configuration.
This option will reload cdr14_xxx Genesis configuration variables and modified content of cdr14.ini without restarting Get process.

Genesis 2000 Version 8.0

Major New Features
DFM & Analysis
Microvia checks - New analyzer for Microvia
ERF reload - Allows reloading modified ERF files without exiting Genesis
I/O Process
Communication with Orbotech plotters & DI via Image Manager
New Excellon & Hitachi laser drill output formats
New Capabilities for Stackup Editor
Support for RCF (resin coated foil) material in the stackup database
Support for RCF use in manual mode
Additional sorting options in the automatic stackup generation popup (not related to RCF)
Better support for microvias
Built-in Sample Automation Package
Installed on new installations only. Hit F4 in Genesis to activate. This package demonstrates how to use Genesis to further automate your CAM processes.
Major Enhancements
Auto Drill Manager
Canned text output
Graphic Editor
Resize special pads (unless they have more than one polarity level)
Engineering Toolkit
Rotate PCB to any angle
Rout Editor
Rout package - Improvements in chaining actions
I/O Process
Improvements in DXF input - better support for surfaces
Gerber output - support for Gerber special symbols (thermals etc)
Excellon, DPF and Solio input preserved with S&R
Support for built-in raster comparison of the results of surface-filling on output. Set the configuration variable iol_fill_validate to yes to activate this comparison. This variable is not initially set to yes because it adds 30-50% to the output time, and we cannot take the liberty of lengthening the customer's output time on our own initiative.
Electrical Test Manager
Improvements in ETM Functionality
Improvements in Setup Utilities

Genesis 2000 Version 7.2c

Enhancements
PC/I Interface
When creating AOI output for Inspire AOI machines, alignment parameters (e.g. polarity, mirror) are written to the output file with no need to define dummy alignment targets.
When an outer layer has features outside a board's profile, the drill layer is no longer shifted on the AOI machine. (KIT 8385)
Dynamic Etch Compensation DFM
Special symbols are now flattened in the calculations.
Spacing to drills is now considered when calculating compensation values.
Etch Compensation now works correctly when two adjacent traces have very different widths and a very obtuse angle (close to 180°) between them. (KIT 8446)
Full Step & Repeat Input for DPF input files
Support added for full step & repeat input for DPF format input files. Genesis looks for the uPCB attribute to identify a block as a PCB.
Nested PCBs are flattened to the first level. Scaled PCBs are not supported.
Stackup Editor
Support added for Foil/Resin (RCC) material.
Support added for blind microvia drill holes.
Auto Rout Manager
A new format has been added for rout output - Hitachi. The previous format that was called Hitachi has been renamed to Hitachi HZ format.
The new Hitachi format supports subroutines.
Fill Algorithms
Step & Repeat Pattern Fill crossing into PCB profiles. Problems resolved (KITs 5717, 8021, and 8166).
Surface Fill problems resolved (KITs 8347, 8430, 8444).
Soldermask Optimization/Analysis
Incorrect warning issued during soldermask optimization (KIT 8457).
Ultra-high precision shapelist enabled (KIT 8390).
Improvements to Parallel Spacing Optimization rerouting methods.
KIT Items

Genesis 2000 Version 7.2b

New Features
Input/Output
A new DXF entity is supported: HATCH.
New output configuration parameter: iol_opfx_allow_out_limits.
Dynamic Etch Compensation
Asymmetric Compensation of Surfaces is now supported.
Smoothing Line Width Differences is now supported.
Controlling Addition of Covered Lines is now supported.
PC/I Orbotech AOI Interface
Select the steps to be inspected with the new "Inspected Steps" field.
ETM
New configuration parameters have been added.
Localized automatic balancing is able to balance select sets of drills.
Sharelists
Beta version of Sharelists is now supported in Genesis.
New Enhancements

Dynamic Etch Compensation
Asymmetric compensation of lines has been improved.
Trace breakage has been improved.
Solder Mask Optimization DFM
Two new categories and one ERF variable have been added.
PC/I Orbotech AOI Interface
Output has been modified to give a correct display of CAM image.
Improved selection of a reference PCB in AOIProg output.
Features outside the panel profile are now supported.
ETM
Drill spacing analysis now reports spacing overlaps between constant drills per plate.
The Pin to Grid algorithm has been improved.
An adaptor can now be edited in an open job.
KIT Items
Over 53 bugs fixed.
Over 12 requests fulfilled.

Genesis 2000 Version 7.2

Major New Features
New DFM actions:
Parallel Spacing Optimization - maximizes spacing between parallel conductor lines
Dynamic etch compensation - especially useful for HDI, where etching process behavior is not uniform
Sliver and Peelable Repair - finds and fixes slivers in signal, power & ground, and solder mask layers - this new DFM reinforces the capabilities of the existing slivers options
New Functionality added to the Electrical Test Manager
GUI - New analysis report
Set up - Pin rules validation, pin group and drill actions
Fixturing - global staggering
Interfaces - Support for L&M vector files and TTU for TTI machines.
Significant Improvements

Flipped step synchronization - Allows better protection on flipped step
Cutting Data - performance improvement & new user interface
Automatic panelization package - includes a panelization setup, new tools, and new panelization wizard capabilities
DP-100 - user-friendly interface for definition and insertion of file parameters for each layer
Gerber RS274x input retains step and repeat information
Netlist Inheritance allows ETM users to test updated board revisions using the fixture created for the previous board revision
Four prepared checklists in new (virgin) installations
Analysis Results Viewer supports measurements in square units
Improvements to Orbotech PC/I AOI Interface
New ERF files for all analysis and DFM actions
New hooks in $GENESIS_DIR/sys/hooks
KIT Items
250 bugs fixed since v7.1
50 requests met since v7.1

Genesis 2000 Version 7.1c

Major New Features

Plot stamp capability in OPF format for Orbotech's LP5008 plotters.
New support to Orbotech's DP-100[tm] direct imaging system.
Enhanced RS274x output - with Step & Repeat.
Support for Enterprise 3000's dynamic ranges and new Signal Quality Analysis measurements.
Bugs Fixed

Genesis 2000 Version 7.1b

Major New Features

Genesis V7.1b now supports Windows 2000.
New features added to PC/I Orbotech AOI interface to Genesis
AOI user defined panelization.
Automatic creation of exclusion zones outside PCBs.
New functionality added to Electrical Testing Manager
Support for testing Stepped & Repeated boards.
Support added for relief pins.
Staggering may be run both on multiple rows and on part of a row.
Netlist Optimizer
New interface to test point generation process.
Significant improvements that were implemented :

Better diagnostics for various input formats.
Self-intersecting polygons are reported whenever they are encountered.
Checklist - improvement that may free significant amounts of memory.
Output - permits direct output to Orbotech Plotters/DI machine.
New warnings have been added to the input process.
Improvements to PC/I Orbotech AOI interface.
Enhancements to cutting data.